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    自动扫描四探针测试仪 上海载德半导体

    Applied to the semiconductor industry:

    Testing Equipment-Electricity Test-全自动探针台

    In stock:

    100

    Place of origin:

    National

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    Own series:Testing Equipment-Electricity Test-全自动探针台

    自动扫描四探针测试仪 上海载德半导体

    技术规格:

    1. 面电阻量测范围: 1 mΩ/sq. to 2 MΩ/sq.(或更高)

    2. 样品尺寸:支持10mm300mm wafer

    3. 量测系统包括:Jandel RM3000测试单元

    4. 测试精度:0.05% at 23

    5. 温度可变范围:-100 ~ 200

    6. 软件操作简单可以支持with Windows XP, Windows 7 Windows 8操作系统,USB2.0 USB3.0接口

    7. 可选择量测晶圆上1, 5, 9, 25, 49, or 121个测试点或者自定义量测图

    8. 可绘制2D3D数据结果图

    9. 输出电阻,电阻率和厚度等量测结果

    10. 系统支持JANDEL探测头,插入式更换,操作简单

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