Surface Detection
Wafer Flatness Tester
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Brand CRYSTAPOL
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用途:用来测量晶圆表面的平整度

主要性能指标 Main performance index

序号

性能指标

1

可测试样品尺寸:直径 ≤152mm
Test sample size: diameter less than 152mm

2

电源:220V, 50HZ
Power supply: 220V, 50HZ

3

激光源:670nm
Laser source: 670nm

4

基准滤镜平整度:λ/10
Reference: lambda /10 flatness filter

5

配置15寸液晶显示器

With LED display  

6

设备尺寸:605mm x 400mm x 500mm (L x H x W)
Size:605mm x 400mm x 500mm (L x H x W)

Contact information
the company:北京欧科天远科技有限公司
status:Offline Send a letter Online conversation
Name:刘经理(Mr)
phone:010-58126650
Mobile phone:13311026650
传真:010-58126650
area:China-北京市
address:北京市中关村南大街铸诚大厦