Wafer Flatness Te...

Negotiable

Kosaka台阶仪（ET1...

Negotiable

表面轮廓仪

Negotiable

TS2000探针台

Negotiable

TS150探针台

Negotiable

红外测厚系统

￥900000.00

Non-contact Thick...

￥200000.00

接触式测厚仪

￥100000.00

表面形貌测试设备

￥100000.00