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    显微硬度测量系统 Helmut Fischer

    Applied to the semiconductor industry:

    Testing Equipment-Surface&internal Inspection-表面硬度检测仪

    In stock:

    1

    Place of origin:

    National

    Quantity:

    cut back increase

    price:

    Negotiable
    Transaction guarantee Secured Transactions Online banking to pay
     特点
     •  无需复杂样品制备的快速测量,HM2000只需要30秒,其压头即可移动到测量面,并完成零位检测
    •  测量过程中零位实时检测
    •   可编程XY测量平台,可用于自动化测量
    •  用户友好的Z轴马达驱动控制
    •  用于精确定位的三种放大倍率的显微镜
    •  大理石框架结构保证几何稳定性,减少热漂移和震动影响
    •  测量暗表面,样品无需进行预处理
    •  由于HT2000测量头出色的热稳定性,精确测量材料蠕变的时间最多可达数小时
     

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