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    半导体/FPD检查显微镜:OLYMPUS MX61系列

    Applied to the semiconductor industry:

    Testing Equipment-Microscope-金相显微镜

    In stock:

    100

    Place of origin:

    National

    Quantity:

    cut back increase

    price:

    Negotiable
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    Own series:Testing Equipment-Microscope-金相显微镜

    产品特点:

    1.为用户提供高效率。MX61适用于最大200mm的样本,而MX61L则可适用于最大300mm的样本。

    2.大型载物台搭载:可用于400*300mm液晶基板,300mm晶圆全面检查

    3.采用高NA的透射光聚光镜,图象更锐利。

    4.多种观察方式,多种照明方式,多种附件以满足不同应用要求。

    5.透射和反射照明可同时使用,极大提高液晶基板观察效果。

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