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    LT-200A LED加速老化与寿命测试系统(含温度特性试验)

    Applied to the semiconductor industry:

    Testing Equipment-Life Test-老化箱

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    LT-200A LED加速老化与寿命测试系统(含温度特性试验)
    用于单颗LED、LED模组的常规老化、加速老化、光通维持特性试验、温度特性试验、寿命试验、颜色偏移测试等,并具备LED寿命推算及预估功能。满足美国“能源之星”LM-80标准及其他相关标准。

    主要技术指标:
    1)90工位(可根据订单调整)LED同时试验,效率高;
    2)可调温恒温试验箱温度控制范围:-20℃--+100℃(根据订单调整);
    3)温度波动度:±0.5℃;
    4)测温精度:±1℃,分辨率:0.1℃
    5)光度线性: 0.2%;
    6)光度复现性: 0.3%;
    7)光纤耐温:-40℃--+150℃;
    8)光谱分析波长范围:350nm-1000nm;
    9)色品坐标重复性: ±0.0003(标准A光源下)
          ±0.0002x,±0.0003y(稳定的蓝光LED)。

     

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