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    奥地利E+E EE355系列 露点仪

    Applied to the semiconductor industry:

    Sensor and Chip-Others

    In stock:

    9999

    Place of origin:

    National

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     奥地利E+E EE355系列 露点仪

                           § 多参数:露点/霜点/体积浓度ppm

                           § 量程:-6060℃

                           § 精度:±2℃

                           § 输出:420mAModbus

                           § 配送:DCS74气体采样器

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