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    ITC 52300

    Applied to the semiconductor industry:

    Testing Equipment-Life Test-老化电源系统

    In stock:

    111111

    Place of origin:

    National

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    Own series:Testing Equipment-Life Test-老化电源系统

     The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)

    Testing meets the requirements of MIL-STD-750, Methods 1026.3, 1027.1, 1036.3, 1037, and 1042.1.
    once set up, the operation of the ITC52300 is fully automatic and can be operated around the clock without operator attention.

    Test devices plug into DUT boards that are plugged into power and monitoring circuits inside a chamber that can hold up to 16 different device test boards with a maximum of 80 devices per board.

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