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    光发射显微镜EMMI

    Applied to the semiconductor industry:

    Testing Equipment

    Product brand

    ADVANCED

    In stock:

    100

    Place of origin:

    China

    Quantity:

    cut back increase

    price:

    Negotiable
    Transaction guarantee Secured Transactions Online banking to pay

    Brand:ADVANCED

    model:

    Own series:Testing Equipment

     光发射显微镜是器件分析过程中针对漏电失效模式,必不可少的分析工具。器件在设计、生产制造过程中有绝缘缺陷,或者期间经过外界静电击穿,均会造成器件漏电失效。漏电失效模式的器件在通电得状态下,内部形成流动电流,漏电位置的电子会发生迁移,形成电能向光能的转化,即电能以光能的方式释放,从而形成200nm~1700nm红外线。光发射显微镜主要利用红外线侦测器,通过红外显微镜探测到这些释放出来的红外线,从而精准的定位到器件的漏电点。我司推出的P-100光发射显微镜(EMMI),在同业中具有超高的性价比,并凭借良好的售后服务,迅速占领市场.目前大中国地区的知名失效分析客户有: 上海宜硕、深圳宜智发、上海闳康、上海矾诠、广州五所、北京电科院、东南大学、乐山菲尼克斯、深圳明微。。。。。。 

                    

                    Junction Leakage                                  Oxide Leakage

                           ESD Damage                        Avalanche-20x Backside Image

     

                          Poly Filaments                              Backside Observation 

      

     

     

     

       

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