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    Wafer Flatness Tester

    Applied to the semiconductor industry:

    Testing Equipment-Surface Detection

    Product brand

    CRYSTAPOL

    In stock:

    1

    Place of origin:

    United Kingdom

    Quantity:

    cut back increase

    price:

    Negotiable
    Transaction guarantee Secured Transactions Online banking to pay

    Brand:CRYSTAPOL

    model:

    Own series:Testing Equipment-Surface Detection



    用途:用来测量晶圆表面的平整度

    主要性能指标 Main performance index

    序号

    性能指标

    1

    可测试样品尺寸:直径 ≤152mm
    Test sample size: diameter less than 152mm

    2

    电源:220V, 50HZ
    Power supply: 220V, 50HZ

    3

    激光源:670nm
    Laser source: 670nm

    4

    基准滤镜平整度:λ/10
    Reference: lambda /10 flatness filter

    5

    配置15寸液晶显示器

    With LED display  

    6

    设备尺寸:605mm x 400mm x 500mm (L x H x W)
    Size:605mm x 400mm x 500mm (L x H x W)

    advisory

    If you have any questions before purchasing, please contact us.

    Question:
     
    Ask

    机器有没有操作台,是只能定点测量吗,能不能移动测量?

    sh66a  2017-07-07

    Ask

    请问显示分辨率是多少,是扫描式观测吗??

    gfty  2017-07-12

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