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    Ultrasound tester

    Applied to the semiconductor industry:

    Testing Equipment-Surface&internal Inspection-其他测试设备

    In stock:

    1000

    Place of origin:

    China-江苏省

    Quantity:

    cut back increase

    price:

    Negotiable
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    ¥10000.00

    Concerned Products

    Scope of application:
    Check the internal peeling, cracks, voids and other defects of IC packaging and electronic parts.

     

    Characteristic:

    High quality (Fine):
    The latest development of 500MHz ultrasonic flaw detector, Dafu improves image quality, high precision scanning, can produce 0.5um resolution graphics 17500 x 7500.
    Fast:
    The speed of the scanner is as high as 1000mm/sec, which is 67% higher than that of the traditional scanner.
    Flexible:
    It can be matched with various probes to provide more customized functions and convenience for use.
    Product function:
    Stereo tilt scanning (S-Image, Hitachi patent):
    Help to get focus more easily.
    Image Index (Hitachi Patent):
    All parameters can be stored at the same time as the image, and images can be quickly obtained for similar objects (Sample).
    Multi-gate Image:
    At a given height, up to 64 layers of images can be obtained.
    Complete Probe combination.

     


     

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