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    半自动探针台(200 mm Semi-Auto Probe Station)

    Applied to the semiconductor industry:

    Testing Equipment-Electricity Test-半自动探针台

    Product brand

    ADVANCED

    In stock:

    50

    Place of origin:

    Taiwan

    Quantity:

    cut back increase

    price:

    Negotiable
    Transaction guarantee Secured Transactions Online banking to pay

    consumer hotline:00864001027270

    Brand:ADVANCED

    model:

    Own series:Testing Equipment-Electricity Test-半自动探针台


          半自动探针台(200 mm Semi-Auto Probe Station)

    八英电动移动平台

    X-Y-Z-R移动行程分别为200mm/200mm/30mm/15degree

    X-Y-Z移动精度1um;R:0.01degree

    机台由PC控制,软件可以建立wafer map

    系统可以根据工程人员建立的wafer map自动点针

    系统可以搭配高倍显微镜和体式显微镜两种光学系统

    光学部分搭配100万象素的数字CCD

    系统具有自动校验功能

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