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    扫描电镜SNE-4500M

    Applied to the semiconductor industry:

    Testing Equipment-Microscope-扫描显微镜

    Product brand

    韩国赛可

    Specification model:

    SNE-4500M

    Delivery period:

    60Day

    In stock:

    1

    Place of origin:

    China-北京市

    Quantity:

    cut back increase

    price:

    500000.00
    Transaction guarantee Secured Transactions Online banking to pay

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    ¥10000.00

    Concerned Products

    Brand:韩国赛可

    model:SNE-4500M

    Own series:Testing Equipment-Microscope-扫描显微镜

     
    技术参数
    1.  分辨率 最大分辨率5nm(30kv,SE Image)
    2.  放大倍率  20x ~ 100,000x
    3.  电压  1kv ~ 30kv(1/5/10/15/20/30)
    4.  探测器 SE (Secondary Electron) 二次
    5.  电子枪 Tungsten Filament(cartridge)
    6.  光阑 30,50,100,200um (Variable type)4挡调节
    7.  扫描图片像素 320×240, 640×480, 1,280×960, 2,560×1,920, 5,120x3,840
    8.  样品台尺寸
     
    X : 40㎜, Y : 40㎜, R : 360˚Z : 0~35㎜, T : 0~45˚ / 5-axis
    9.  样品尺寸(直径/高度) 80mm / 高度35mm
    10. 真空模式  High Vacuum高空系 (Low Vacuum低空系)
    11. 真空时间 180sec(抽空), 70sec(卸空)
    12. 能谱系统 EDAX(布鲁克)(选配)

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