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    激光全息光学检漏系统:NorCom2020 SF-12

    Applied to the semiconductor industry:

    Testing Equipment-Surface&internal Inspection

    In stock:

    100

    Place of origin:

    National

    Quantity:

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    price:

    Negotiable
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    Own series:Testing Equipment-Surface&internal Inspection

          基于密封件漏率国际标准计算方法而设计的一款设备,利用激光全息3D 成像技术,通 过给密封件外部施加不同的压力,实时精确的检测工件的体积随内外压差的变化,并根据工 件自身的其他特性参数(如:如元器件材料刚度、空腔体积等)与形变的相关性,通过软件 分析计算而获得元器件的漏率数据。使用的加压气体可以为:空气,氮气,氦气等。适合各种封装电子元器件。

    产品特点:

    1.无损、快速、重复性好;

    2.操作简单,对操作人员友好,环保;

    3.同时粗检漏和细检漏,如右表所示;

    4.报告每个器件的实际氦漏率;

    5.适合金属、陶瓷、玻璃及组合封装;

    6.可检测已安装到电路板上的元器件;

    7.可检测吸收或发射氦气材料的封装件,如:光纤引线、陶瓷等;

    8.少量或批量生产检测;既满足小批量检测需求,也可实现在线检测,大大提升生产效率和

    质量控制水平;

    9.自动生成检测报告

     

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